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Advanced Nanomeasurement Solutions for Research, Industry and Education
Whether your application requires a high-resolution system that offers modularity and cross-platform compatibility for atomic force microscopy (AFM) and scanning probe microscopy (SPM), a nanoindenter or universal testing machine (UTM) optimized for high-precision nanomechanical characterization, or a compact, low-voltage system that delivers exceptional field emission scanning electron microscopy (FE-SEM) performance, Keysight Technologies, Inc. can provide the right state-of-the-art instrumentation for your work with its R&D committed to the pursuit of advancements that will make atomic force microscopy easier to use. The company further provides application expertise for life science, materials science, polymer science, electrochemistry, and cross-disciplinary nanoscale research.
Compact Scanning Electron Microscope with Unparalleled Imaging
The FlexSEM 1000 VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package. Cutting-edge technology and circuitry provides unrivalled imaging performance, even in variable-pressure environments, a feature previously only available in a full-sized SEM. This SEM runs on clean energy for an economical analytical tool, without compromising performance.